product description 

Product details

The PXY-4190 is a powerful PXI LCR meter designed to measure the inductance, capacitance and resistance (LCR) of electronic devices. It combines the high precision measurement capability of the LCR meter with the source output capability of the Precision Source Measurement Unit (SMU) to provide users with a comprehensive test solution.

The PXIe-4190's outstanding performance is reflected in its test frequency of up to 2 MHz and measurement range of up to 40 V, which enables it to accurately measure LCR parameters of various electronic devices. At the same time, its fF capacitance measurement and fA current measurement capabilities ensure high accuracy and reliability of the measurement.

The application scenarios of the PXIe-4190 are very broad. It can be used for testing integrated passive devices (IPD), micro-electro-mechanical systems (MEM) and multi-layer ceramic capacitors (MLCC) in semiconductor applications. In addition, it can be used for parametric testing to help users fully understand and evaluate the performance of electronic devices.

The PXIe-4190's automated test system is a major highlight. Users can easily build a capacitance-voltage/current-voltage (CV/IV) automatic test system to realize the automation and intelligence of the test process. This not only improves the test efficiency, but also reduces the test cost.

In addition, the PXIe-4190 is fully supported by NI-DCPower instrument drivers. This means that users can program and control using a variety of programming languages such as LabVIEW, C, C#.NET, Python, and so on, achieving seamless integration with other test devices and systems.

Overall, the PXIe-4190 is a powerful, high-performance PXI LCR watch. With its high precision measurement, wide range of application scenarios and powerful automatic test system, it is the ideal choice in the field of electronic equipment testing and development.

Product Parameter

Model Number: PXIe-4190

Origin:USA

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