product description 

Product details

The PXIe-4163 is a high-precision, high-density PXI Source Measurement Unit (SMU) designed to meet complex test requirements. Its unique 12-channel architecture enables the PXIe-4163 to process multiple channels simultaneously in a single test, greatly improving test efficiency.

Each channel has four-quadrant operation capability, so PXY-4162 can be used not only as a power supply for the equipment to be tested, but also as a precision measuring instrument to measure voltage, current and other parameters. This flexibility allows the PXIe-4163 to be adapted to a variety of test scenarios, whether it is power characteristic analysis, semiconductor parameter testing, or other complex electronic measurement tasks.

To ensure accurate measurement, the PXIe-4163 incorporates remote (4-wire) sensing in each channel. This function can effectively eliminate the influence of wire resistance on the measurement results, thus ensuring the accuracy of the measurement results. At the same time, the PXIe-4163 also uses advanced analog-to-digital converter technology to further improve the measurement accuracy and resolution.

In addition, the PXY-4162 features a protective terminal design that effectively eliminates the effects of leakage current and parasitic capacitance. This design not only improves the reliability of the test, but also protects the equipment under test from potential damage.

It is worth mentioning that the PXIe-4163 also uses SourceAdapt technology. This technology automatically adjusts the transient response according to the characteristics of the load, ensuring stable output and accurate measurement results during testing. This characteristic makes PXIe-4163 excellent in testing various types of semiconductor devices, both low and high impedance devices, to obtain accurate and reliable test results.

In summary, the PXIe-4163 is a powerful and excellent PXI source measurement unit. With its high precision, high density, four-quadrant operation capability and advanced measurement technology, it has become an indispensable test tool in semiconductor production testing. The PXIe-4163 provides accurate and reliable test solutions for both characteristic analysis during the development phase and quality control on the production line.

Product Parameter

Model Number: PXIe-4163

Origin:USA

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