product description 

Product details

The PXIe-6570 is a 2-slot PXI digital mode instrument designed for semiconductor characteristics and production testing with processing speeds of up to 100 MVector/s. This instrument provides a vector-based PXI digital channel board that provides users with powerful configuration capabilities, including pin mapping, specification, level, timing and pattern Settings.

The PXIe-6570's pin-mapping capability allows users to flexibly configure the pin connections of the digital channel according to test requirements, thus adapting to different semiconductor test scenarios. The specification setting function can help you define the parameters required for the test to ensure the accuracy and reliability of the test.

In addition, the PXIe-6570 also supports a variety of level standards, and users can choose the right level to configure according to test requirements. The timing function allows the user to precisely control the sending and receiving time of the digital signal, ensuring the synchronization and stability of the test.

In addition to the basic configuration features, the PXIe-6570 also provides a wealth of debugging tools and viewers to help users better conduct semiconductor testing. Among them, Shmoo debugging tool can help users quickly locate and solve the problem in the test; The digital oscilloscope can display the change of the digital signal in real time, which is convenient for users to observe and analyze; Historical RAM, pin status, and system status viewers provide detailed test data and status information to help users get a complete picture of their tests.

Overall, the PXIe-6570 is a powerful and flexible PXI digital mode instrument for a variety of semiconductor characteristics and production test scenarios. It provides powerful configuration capabilities and rich debugging tools to help users efficiently and accurately complete semiconductor testing tasks.

Product Parameter

Model Number: PXIe-6570

Origin:USA

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